JFET Bias Circuit Troubleshooting: Voltage Measurement - JFET Bias Circuit Troubleshooting are similar to those for BJT bias circuits. The major difference is that there is only one junction in…
Common Collector Circuit Analysis: In the Common Collector Circuit Analysis (CC) shown in Fig. 6-28 the external load (RL) is capacitor-coupled to the transistor emitter terminal. The circuit uses voltage divider…
Common Emitter Amplifier Circuit: Consider the Common Emitter Amplifier Circuit circuit shown in Fig. 6-17. When the capacitors are regarded as ac short-circuits, it is seen that the circuit input…
AC Load Line of BJT: AC Equivalent Circuits - Capacitors behave as short-circuits to ac signals, so in the ac equivalent circuit for a transistor circuit all capacitors must be…
BJT Bias Circuit Troubleshooting: Voltage Measurement - When a BJT Bias Circuit Troubleshooting is constructed in a laboratory situation, the supply voltage (VCC) and the voltage levels at the transistor…
Transistor Testing Circuit: In-Circuit Testing - A quick test to check if a transistor is operational can be performed while the device is still connected in a circuit. Consider Fig.…
Testing of Semiconductor Diode: There are Several methods are available for Testing of Semiconductor Diode, namely, Ohmmeter Tests: One of the simplest and quickest tests can be made using an ohmmeter…
Electrical Drive Systems: Each Electrical Drive Systems is different from other Electrical Drive Systems. However, there are some common features associated with all Electrical Drive Systems. To understand them it…